2020.11.18
Overview
A stamping quality inspection system including a stamping device, a signal detecting element and a processor is disclosed. The signal detecting element is coupled to the stamping device for detecting a sound signal and a vibration signal of the stamping device. The processor is coupled to the signal detecting element for determining a stamping operation time interval according to the sound signal and the vibration signal, and to compare the sub-sound signal of the sound signal and the sub-vibration signal of the vibration signal within the stamping operation time interval with a mode comparison model to produce a quality test result.Category
發明
Patented
109140385
發明第I789645號
Filing Date
2020.11.18Expired Date
2040.11.17Notification
2023.11.10