2021.11.15
Overview
A system and a method to assess abnormality are disclosed. The system is connected to an image capturing device and has multiple classifier models and a processing module. Each one of the classifier models is alternately trained by supervised-learning and unsupervised-learning. Parameters of the multiple classifier models are different from each other. The processing module is connected to the multiple classifier models. The processing module receives an under-test image and outputs the under-test image to the multiple classifier models to respectively obtain multiple under-test eigenvectors and to generate an abnormality assessment information.Category
發明
Applying
202111346382.X
Filing Date
2021.11.15Notification
2023.11.10